Are you looking to hire a new database administrator? Conducting a thorough interview is an important first step in the recruitment process. Asking the right questions can help you identify the best candidate for the job. To help you in your search, we have compiled a list of essential interview questions for a Database Administrator to ask. These questions will help you assess the candidate’s skills and determine whether they are the right fit for the role. With the right questions, you can gain insight into the candidate’s knowledge and expertise in database administration, as well as their experience working with databases. Asking the right questions and getting answers that match your requirements are key to finding the perfect candidate. So, read on to learn the best interview questions to ask when interviewing a Database Administrator.
- Why DFT? …
- What are the topics in DFT? …
- What is DFT and Why DFT require ? …
- what is effect of technology shrink on DFT work/Methodology ? …
- what is mean by testability/Controllability/observability/coverage. …
- what is the difference between fault coverage and test coverage ?
EXPERT’s TALK – DESIGN FOR TESTABILITY (DFT) | HOW TO MAKE CAREER IN FRONTEND VLSI & DFT | MBIST
Interview tips
Here are some hints you might take into account as you get ready for your interview:
Questions about experience and background
The majority of the interview may be devoted to inquiries about your education, skills related to DFT, and experience. These inquiries frequently assist interviewers in figuring out how you use your skills and whether your aptitudes match the demands of the job description. Heres a list of common experience-based DFT interview questions:
What techniques do you use to reduce pattern count without losing coverage?
This role-specific question is frequently asked in interviews to determine how you might respond in a similar situation at work. They may use this query to assess your level of expertise and subject knowledge. Please answer this question by briefly outlining the procedure you employ.
As an illustration, “Different ATPG tools offer various compression and pattern ordering techniques to aid in reducing pattern count. Chain balancing during stitching or scan insertion is the first step. I can reach the necessary flop with fewer dummy patterns if I balance my chains. Where there are restrictions on the device’s pins, I can also include compression on the chains. This means that if I have a compression factor of 2, the device will split my single scan chain into two. This reduces the chain length. “.
How to prepare for the Verilog Interviews?
The following skill-sets are necessary for the trainee to pass Verilog interviews:
Verilog HDL trained in RTL & Test bench.
9) What do you mean by clock skew? 10) Is Hold time dependent on clock frequency? 11) Is clock skew advantageous or not? 12) What is the most recent technology node being used in industry? 13) Is set up time-dependent on clock frequency? 14) Why do you need a reset in a flip flop? 15) What is the multicycle path? 16) Are there any tools for DFT?
Interview Questions of Top Designations
FAQ
What is DFT interview questions?
- Can you explain the scan insertion steps? …
- What is test point insertion? …
- What is scan compression, and how does it work? …
- Can you explain some uses of clock gating in design?
What is DFT in semiconductor?
Integrated circuit design, or IC design, is a subfield of electronics engineering that encompasses the specific logic and circuit design techniques required to design integrated circuits, or ICs. Design for testing, or design for testability (DFT), includes IC design. https://en. wikipedia. org › wiki › Integrat. techniques that enhance a hardware product’s testability, as described in Wikipedia’s article on integrated circuit design The additional features simplify the development and implementation of manufacturing tests for the created hardware.
What is scan insertion in DFT?
Scan Insertion: Tool Objective. SCAN is a DFT design method used in IC Design to improve a circuit’s overall testability. By adding test vectors to device pins, the SCAN insertion architecture makes it possible to test each logic element in the IC regardless of where it is located.
What is the star method in interviewing?
The STAR method is a structured way of answering a behavioral interview question by outlining the precise circumstance, duty, course of action, and outcome of the circumstance you are describing.
